Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging

C. Trager-Cowan, F. Sweeney, A. Winkelmann, A.J. Wilkinson, P.W. Trimby, A.P. Day, A. Gholinia, N.H. Schmidt, P.J. Parbrook, I.M. Watson

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

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