Corrigendum: Cathodoluminescence nano-characterization of semiconductors (2011 Semicond. Sci. Technol. 26 064005)

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In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.
Original languageEnglish
Article number079501
Number of pages1
JournalSemiconductor Science and Technology
Early online date21 May 2018
Publication statusPublished - 6 Jun 2018


  • cathodoluminescence
  • semiconductors

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