Estimating fluorescence lifetimes using extended Kalman filter

Kai Gao, David Li

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The extended Kalman filter (EKF) has been widely used in communication, signal processing and navigation control. In this Letter, the authors applied EKF, for the first time to their knowledge, to simultaneously estimate fluorescence lifetimes and instrument response functions (IRF) for time-domain fluorescence lifetime imaging microscopy (FLIM) systems (we focus on gating and time-correlated single-photon counting techniques in this work). Monte-Carlo simulations were performed to test its performances in comparison with previously reported methods. Simulation results show that the proposed algorithm can achieve comparable or better results than the others. More importantly, with EKF there is no need to measure the IRF of the FLIM system.
Original languageEnglish
Pages (from-to)1027-1028
Number of pages2
JournalElectronics Letters
Issue number15
Early online date21 Jun 2017
Publication statusPublished - 20 Jul 2017


  • Monte Carlo simulation
  • FLIM system
  • fluorescence
  • image filtering
  • Kalman filters
  • optical filters

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