Grain refinement in copper via cryogenic deformation

T. N. Konkova, S. Yu Mironov, A. V. Korznikov

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The high-resolution electron backscatter diffraction (EBSD) was employed to study microstructure produced by cryogenic high-pressure torsion of copper. The long term (∼11 months) thermal stability of the obtained material at room temperature was also evaluated. It has been established that severe cryogenic deformation leads to a considerable grain refinement down to 0.3 μm. However the obtained material was shown to be quite unstable exhibiting abnormal grain growth at ambient temperature.

Original languageEnglish
Pages (from-to)31-35
Number of pages5
JournalReviews on Advanced Materials Science
Issue number1
Publication statusPublished - 2012


  • Grain refinement
  • copper
  • electron backscatter diffraction
  • cryogenic deformation
  • cryogenic high-pressure torsion

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