Photoluminescence and phonon satellites of single InGaN/GaN quantum wells with varying GaN cap thickness

L.T. Tan, R.W. Martin, K.P. O'Donnell, I.M. Watson

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Variations in thickness of the GaN caps above single InGaN quantum wells have been studied using photoluminescence spectroscopy. Data are presented from two series of samples designed to promote energy transfer to luminescent species on the surface. Improvements in the optical properties as the GaN cap thickness increases from 2.5 to 15 nm are accompanied by clear changes in the intensity of the LO-phonon satellites. Analysis of the strength of successive phonon satellites and the associated Huang-Rhys factors indicates that the amount of localization of the excitons is increased for the thinner cap samples. Surface depletion fields are also considered.
Original languageEnglish
Article number101910
Number of pages3
JournalApplied Physics Letters
Issue number10
Publication statusPublished - 4 Sep 2006


  • indium compounds
  • phonon-exciton interactions
  • photoluminescence
  • semiconductor quantum wells
  • III-V semiconductors
  • gallium compounds

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