Solid immersion facilitates fluorescence microscopy with nanometer resolution and aub-angström emitter localization

Dominik Wildanger, Brian R Patton, Heiko Schill, Luca Marseglia, JP Hadden, Sebastian Knauer, Andreas Schönle, John G Rarity, Jeremy L O'Brien, Stefan W Hell

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Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
Original languageEnglish
Pages (from-to)OP309–OP313
Number of pages5
JournalAdvanced Materials
Issue number44
Publication statusPublished - 12 Sep 2012


  • far-field optical imaging
  • solid immersion lenses (SIL)
  • stimulated emission depletion (STED) microscopy

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